DataMuseum.dk

Presents historical artifacts from the history of:

CR80 Hard and Floppy Disks

This is an automatic "excavation" of a thematic subset of
artifacts from Datamuseum.dk's BitArchive.

See our Wiki for more about CR80 Hard and Floppy Disks

Excavated with: AutoArchaeologist - Free & Open Source Software. 

top - download

⟦ea96ebaae⟧ TextFile

    Length: 1938 (0x792)
    Types: TextFile
    Names: »RELDESCR.T«

Derivation

└─⟦e0c43619c⟧ Bits:30005797 CR80 Disc pack ( Vol:FNJ1 861029/EC CR80 S/W Package II+III+IV+V+VII )
    └─ ⟦this⟧ »CSP007_V0501.D!CSS7002.D!RELDESCR.T«

TextFile

«ff»
*******************************************************

         R E L E A S E   D E S C R I P T I O N

*******************************************************




Module id number: CSS/7002
--------------------------

Module name:      MEMORY_TEST
-----------------------------------

Actual release:   02.03            Release date: 851111
-----------------------            --------------------

Previous release: 02.02            Release date: 850722
-----------------------            --------------------




New facilities:
---------------
 02.01) The Patch Lower byte (PL) and Patch Upper byte (PU)
        commands have been added.

 01.02) The Error Detecting and Correcting test is now implemented.
 01.03) Four input commands are implemented for the EDC RAM.
        The commands are: ARSC,ARED,ADMW and ADCW.
 01.03) The command SHWT is implemented in error reporting procedures.


Changes:
--------

 02.03) This version uses TPE ver. 03.01.

 02.02) The REFRESH test is the last test in TEST ALL now.(PR85063)

 02.01) The help-facility (?) was corrected and updated.

 01.03) The EDC test has completely changed. The test contains now
        five subtests.
 01.03) The facilities abort_program_on_error and abort_command_on_
        error have been implemented in the Report_error procedure.

Errors corrected:
-----------------

 02.01) A Type-2 dependency, which caused an `illegal instruction`
        when performing a memory test on a bad LTU, was removed.

Reported errors, not corrected:
-------------------------------

 02.02) The EDC test is not a part of the TEST ALL, because EDC is
        only implemented on CPU type 8 ( MX type 2 ), the test
        program is not clever enough to skip the test while running
        on MX type 1. Infact, running EDC test on type 1 gives
        unpredictable results.(PR85063)

CPECRs implemented in current release: PR85063
--------------------------------------
 «a5»