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RC703_Built-in_Testsystem.pdf

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   BitStore.Metadata_version:
   	1.0
  
   BitStore.Access:
   	public
  
   BitStore.Filename:
   	RC703_Built-in_Testsystem.pdf
  
   BitStore.Size:
   	376444
  
   BitStore.Format:
   	PDF
  
   BitStore.Ident:
   	30005325:1
  
   BitStore.Digest:
   	sha256:6c027f0466eacaecaf42b3fed4d08f7d911cd43fe7d13e659c2818a8758594cf
  
   BitStore.Last_edit:
   	20230721 Søren.Roug
  
   DDHF.Keyword:
   	RC/RC700/HW
   	RCSL/44/RT
  
   Document.Title:
   	RC703 Built-in Testsystem Version 1.0 User's Guide
  
   Document.RCSL:
   	RCSL-44-RT-2060
  
   Document.Author:
   	Steen Nørgaard
  
   Document.Date:
   	March 1983
  
   Document.Description:
   	This manual describes the built-in testsystem and the
   	test programs for the RC703 Piccolo. The test programs
   	described in this manual are: the memory test, the DMA
   	test, the CTC test and the FDD test.
  
   *END*

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• Bits:Keyword/RC/RC700/HW ‎ (← henvisninger)
• Bits:Keyword/RCSL/44/RT ‎ (← henvisninger)